2D-EMMA

The 2D-EMMA consortium consists of young ambitious researchers from five different Italian regions It aims at developing integrated manufacturing technology for 2D materials based on a novel and technologically relevant growth technique, namely ionized jet deposition. It will also allow overcoming critical experimental problems, such as controlled interfacing, and exploring new integrated electronic and sensing device concepts. This would allow 2D materials to enter the semiconductor roadmap, the key to unlocking their commercial potential.
We will bundle our different know-hows and complementary strengths to expand multi-modal in-operando characterization of nanomaterials like TMDs in technologically relevant device architectures under operative conditions. Our focus for advanced operando characterization will be on scanning probe techniques and electron spectroscopy, which are among the most wide-spread and versatile characterization techniques in modern science, used across all disciplines in academia and industry. The project will allow us to discover the fundamental mechanisms under true operative constraints to have a leveraged impact on the
nanomaterials’ effective design and functionality.